Conference Proceedings
ICAM 2008 - Ninth International Congress for Applied Mineralogy
Conference Proceedings
ICAM 2008 - Ninth International Congress for Applied Mineralogy
Chemically Pure Synthetic Standards for Wide Range Analysis of Oxides in Geological Material Using Wavelength Dispersive X-Ray Fluorescence Spectrometry
X-ray fluorescence (XRF) spectrometry has always been considered to be a comparative method of analysis. Reference materials are required to calibrate the analytical system. This paper describes the use of a set of synthetic' oxide standards, made from commercially available high purity compounds, to calibrate a spectrometer for 21 major and minor oxides. The spectrometer software uses simple methods of background correction, and a fundamental parameter method of matrix correction. Sample preparation is by fusion in 66 per cent lithium tetraborate, 34 per cent lithium metaborate. The use of synthetic standards, made from traceable compounds, brings XRF significantly closer to being a primary rather than a comparative method._x000D_
Reference materials were used to validate the method described and examples of accuracy for major constituents are given using ores and other minerals. This method has successfully been used to analyse a wide variety of minerals and ores, as validation data shows. A titanium process example clearly shows the benefits of highest accuracy analysis.
Reference materials were used to validate the method described and examples of accuracy for major constituents are given using ores and other minerals. This method has successfully been used to analyse a wide variety of minerals and ores, as validation data shows. A titanium process example clearly shows the benefits of highest accuracy analysis.
Contributor(s):
M S Olde Weghuis, M N Ingham
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- Published: 2008
- PDF Size: 0.206 Mb.
- Unique ID: P200808023