Computer-controlled microscopes with digital image acquisition and analysis led to the creation of the new field of digital microscopy. These techniques not only allow a certain degree of automation but have also brought new possibilities to microstructural characterisation. One of these new and promising possibilities is co-site microscopy, which links different kinds of information obtained from different microscopy techniques._x000D_
The present work presents the development and implementation of a co-site microscopy methodology that combines images obtained by reflected light microscopy (RLM) and scanning electron microscopy (SEM). This methodology can improve the SEM analytical capacity by adding colour information from RLM. It involves the whole sequence, from image acquisition at the microscopes to the analysis of the phases using pattern recognition techniques. An automatic registration procedure for the two kinds of images was developed, allowing the adjustment of magnification, translation, rotation and pixel size, and the correction of local distortions. Thus, the images from RLM and SEM can be combined to build a multidimensional data set of each field, which can then be used in a pattern recognition approach to discriminate different phases._x000D_
The methodology was tested with a copper ore sample, aiming at the discrimination of minerals that are not distinguishable with either RLM or SEM.