Many sampling standards arrive at a value for the prescribed sample mass by assuming a specific relation between the sample mass and the relative standard deviation of the fundamental error and assigning a value to the tolerated coefficient of variation. In order to obtain an equation that provides a relation between the minimum sample mass and the particle properties, many different models for the drawing of a sample have been developed. Here, a model for the drawing of a sample is proposed which can be considered to be a generalisation of the model used in Gy's sampling theory. Using simulations, it is illustrated that the generalised model can lead to a better correspondence with actual sampling processes.